RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range by Daniel Müller

RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range

Daniel Müller

202 pages missing pub info (editions)

nonfiction art technology
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Description

Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates th...

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